Title:
CONNECTOR ASSEMBLY WITH SEPARATE TEST PROBE OPENING
Document Type and Number:
WIPO Patent Application WO/2018/120034
Kind Code:
A1
Abstract:
A connector assembly (10) includes a terminal (12) and a housing (20). The terminal (12) defines a contact area (14) configured to receive and electrically contact a pin (16) of a mating connector (18) when the connector assembly (10) is connected to the mating connector (18). The housing (20) supports the terminal (12). The housing (20) has a first opening (22) and a second opening (24), the first opening (22) being configured to guide the pin (16) into the contact area (14) of the terminal (12) when the connector assembly (10) is connected to the mating connector (18), and the second opening (24) being configured to guide a test probe (26) toward a test point (28) of the terminal (12), wherein the test point (28) is spaced apart from the contact area (14).
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JP2957174 | [Title of Invention] IC Card Connector |
WO/2004/032035 | CONNECTOR FOR CARD |
WO/2008/085780 | BACKWARD COMPATIBLE CONNECTOR SYSTEM |
Inventors:
LU TIANFU (CN)
ZHAO HONGCHANG (CN)
GAO GUOLIN (CN)
ZHAO HONGCHANG (CN)
GAO GUOLIN (CN)
Application Number:
PCT/CN2016/113536
Publication Date:
July 05, 2018
Filing Date:
December 30, 2016
Export Citation:
Assignee:
DELPHI PACKARD ELECTRIC SYSTEMS COMPANY LTD (CN)
International Classes:
H01R13/64; H01R13/40
Foreign References:
CN1264193A | 2000-08-23 | |||
US6068512A | 2000-05-30 | |||
CN204633037U | 2015-09-09 | |||
CN105144493A | 2015-12-09 | |||
CN1219784A | 1999-06-16 | |||
US6659811B2 | 2003-12-09 |
Attorney, Agent or Firm:
SHANGHAI PATENT & TRADEMARK LAW OFFICE, LLC (CN)
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