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Patent Searching and Data


Title:
CONSTITUTIVE DEVICE QUALITY DETERMINATION SERVER, INSPECTION SYSTEM, INSPECTION SYSTEM TERMINAL DEVICE, AND INSPECTION DEVICE
Document Type and Number:
WIPO Patent Application WO/2019/180861
Kind Code:
A1
Abstract:
This constitutive device quality determination server is communicably connected, via the Internet, to an inspection device which inspects, while operating, a constitutive device included in a base board processing machine in accordance with the type of inspection to be performed on the constitutive device, the server comprising: an inspection data acquisition unit for specifying a predetermined type of inspection for an inspection device and acquiring inspection data obtained from inspection performed by the inspection device; a determination unit for determining the quality of the constitutive device on the basis of the acquired inspection data; and a transmission unit for sending the quality determination result from the determination unit to a terminal device communicably connected via the Internet.

Inventors:
HOSHIKAWA KAZUMI (JP)
MURAKAMI HIROSHI (JP)
Application Number:
PCT/JP2018/011298
Publication Date:
September 26, 2019
Filing Date:
March 22, 2018
Export Citation:
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Assignee:
FUJI CORP (JP)
International Classes:
H05K13/00
Domestic Patent References:
WO2013153598A12013-10-17
WO2013153598A12013-10-17
Foreign References:
JP2000236197A2000-08-29
JPH0535751A1993-02-12
JP2014027064A2014-02-06
JP2002181728A2002-06-26
Other References:
See also references of EP 3771307A4
Attorney, Agent or Firm:
KOBAYASHI Osamu et al. (JP)
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