Title:
CONSTITUTIVE DEVICE QUALITY DETERMINATION SERVER, INSPECTION SYSTEM, INSPECTION SYSTEM TERMINAL DEVICE, AND INSPECTION DEVICE
Document Type and Number:
WIPO Patent Application WO/2019/180861
Kind Code:
A1
Abstract:
This constitutive device quality determination server is communicably connected, via the Internet, to an inspection device which inspects, while operating, a constitutive device included in a base board processing machine in accordance with the type of inspection to be performed on the constitutive device, the server comprising: an inspection data acquisition unit for specifying a predetermined type of inspection for an inspection device and acquiring inspection data obtained from inspection performed by the inspection device; a determination unit for determining the quality of the constitutive device on the basis of the acquired inspection data; and a transmission unit for sending the quality determination result from the determination unit to a terminal device communicably connected via the Internet.
Inventors:
HOSHIKAWA KAZUMI (JP)
MURAKAMI HIROSHI (JP)
MURAKAMI HIROSHI (JP)
Application Number:
PCT/JP2018/011298
Publication Date:
September 26, 2019
Filing Date:
March 22, 2018
Export Citation:
Assignee:
FUJI CORP (JP)
International Classes:
H05K13/00
Domestic Patent References:
WO2013153598A1 | 2013-10-17 | |||
WO2013153598A1 | 2013-10-17 |
Foreign References:
JP2000236197A | 2000-08-29 | |||
JPH0535751A | 1993-02-12 | |||
JP2014027064A | 2014-02-06 | |||
JP2002181728A | 2002-06-26 |
Other References:
See also references of EP 3771307A4
Attorney, Agent or Firm:
KOBAYASHI Osamu et al. (JP)
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