Title:
CONTACT PROBE ASSEMBLY
Document Type and Number:
WIPO Patent Application WO/2023/003251
Kind Code:
A1
Abstract:
The present invention relates to a contact probe assembly and, more specifically, to a vertical contact probe assembly. The present invention provides a contact probe assembly which is used to test an electronic device, and comprises: a first support having a first surface, a second surface opposite to the first surface, and a plurality of first through-holes formed to pass through the first and second surfaces; and a plurality of contact probes inserted in the first though-holes, respectively.
Inventors:
KIM HAK JUN (KR)
KIM SUK MIN (KR)
LEE TAE JONG (KR)
KIM SUNG HO (KR)
KIM SUK MIN (KR)
LEE TAE JONG (KR)
KIM SUNG HO (KR)
Application Number:
PCT/KR2022/010172
Publication Date:
January 26, 2023
Filing Date:
July 13, 2022
Export Citation:
Assignee:
SAE HAN MICRO TECH CO LTD (KR)
International Classes:
G01R1/067; G01R1/073
Foreign References:
| KR20200104061A | 2020-09-03 | |||
| KR102145398B1 | 2020-08-19 | |||
| KR20180031271A | 2018-03-28 | |||
| KR20180052314A | 2018-05-18 | |||
| KR20170125070A | 2017-11-13 | |||
| KR102321081B1 | 2021-11-03 |
Attorney, Agent or Firm:
DYNE PATENT & LAW FIRM (KR)
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