CONTACT PROBE AND TEST SOCKET EQUIPPED WITH SAME

Title:

CONTACT PROBE AND TEST SOCKET EQUIPPED WITH SAME

Document Type and Number:

WIPO Patent Application WO/2020/026409

Kind Code:

A1

Abstract:

Provided are: a contact probe that can easily accommodate mass production, reduce manufacturing costs, and achieve a stable contact state with an electrode such as a land for a test substrate; and a test socket equipped with the same. This contact probe (100) is provided with: a first contact terminal (10) that contacts a solder ball (5) of an object to be tested (4); a second contact terminal (20) that contacts a land (7) of a printed circuit board (6); and a coil spring (81) that biases the contact terminals (10, 20) to separate the same, wherein the first contact terminal (10) is configured by a first contact element (11) formed as a rod-like metal member, and the second contact member (20) is configured by two second contact elements (21A, 21B) that are formed as plate-like metal members and pinch the first contact element (11) while in friction contact with a portion of the first contact element (11).

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Inventors:

IWASAKI HIDEKAZU (JP)
ARAI KAZUAKI (JP)

Application Number:

PCT/JP2018/029019

Publication Date:

February 06, 2020

Filing Date:

August 02, 2018

Export Citation:

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Assignee:

UNITECHNO INC (JP)

International Classes:

G01R1/067

Domestic Patent References:

WO2011036935A1	2011-03-31
WO2017141564A1	2017-08-24

Foreign References:

JP2016075709A	2016-05-12
JP2012181096A	2012-09-20

Attorney, Agent or Firm:

ARIGA, Gunichiro et al. (JP)

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