Title:
CONTACT PROBE, PROBE UNIT, AND METHOD OF ASSEMBLING PROBE UNIT
Document Type and Number:
WIPO Patent Application WO/2010/061857
Kind Code:
A1
Abstract:
A contact probe such that the direction of deflection of the contact probe due to an externally applied load is controlled, the contact probe can be easily mounted in a unit, and the contact probe can be efficiently maintained after being mounted in the unit. The width of an elastically buckling section (22) in a predetermined direction, the elastically buckling section (22) being adapted to be elastically buckled by an externally applied load, changes along the longitudinal direction of the elastically buckling section (22), and a plane passing through a load application point (T) of a first contact section (21) in the longitudinal direction of the elastically buckling section (22) is offset so as not pass through the midpoint (M) of the elastically buckling section (22), said midpoint (M) being a point at which the width of the elastically buckling section (22) in the predetermined direction changes significantly. The contact probe is provided with an arm section (24) extended in a plate shape in the direction perpendicular to a pillar-like section including the elastically buckling section (22).
Inventors:
ISHIKAWA KOJI (JP)
TOMINAGA JUN (JP)
TOMINAGA JUN (JP)
Application Number:
PCT/JP2009/069883
Publication Date:
June 03, 2010
Filing Date:
November 25, 2009
Export Citation:
Assignee:
NHK SPRING CO LTD (JP)
ISHIKAWA KOJI (JP)
TOMINAGA JUN (JP)
ISHIKAWA KOJI (JP)
TOMINAGA JUN (JP)
International Classes:
G01R1/073; G01R1/067
Foreign References:
| JP2001074779A | 2001-03-23 | |||
| JPH11344508A | 1999-12-14 | |||
| JPH11125646A | 1999-05-11 |
Attorney, Agent or Firm:
SAKAI, HIROAKI (JP)
Hiroaki Sakai (JP)
Hiroaki Sakai (JP)
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