CONTACT PROBE AND PROBE UNIT

WIPO Patent Application WO/2012/008541

A1

A plate-shaped contact probe (20) connecting different substrates, and being provided with: a conduction part which comprises a first contact section (21) that has a side surface curved in an arc shape at a leading end and is in contact with one substrate at the side surface, a second contact section (22) that has a side surface curved in an arc shape and is in contact with the other substrate at the side surface, and a connection section (23) that connects the first contact section (21) and the second contact section (22); and an elastic part (24) which is formed using a metallic plate (201) having a maximum usage temperature higher than or equal to the maximum value of a usage environment temperature, extends from the second contact section (22), has a portion curved in an arc shape, and is elastically deformed by a load applied to the first contact section (21) and the second contact section (22), the conduction part including a metallic plate (202) produced from a conductive material different from the elastic part (24).

MOTEGI, Takahiro (3-10, Fukuura, Kanazawa-ku, Yokohama-sh, Kanagawa 04, 〒2360004, JP)
茂木　孝浩 (〒04 神奈川県横浜市金沢区福浦３丁目１０番地　日本発條株式会社内 Kanagawa, 〒2360004, JP)

JP2011/066141

January 19, 2012

July 14, 2011

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NHK SPRING CO., LTD. (3-10, Fukuura Kanazawa-ku, Yokohama-sh, Kanagawa 04, 〒2360004, JP)
日本発條株式会社 (〒04 神奈川県横浜市金沢区福浦３丁目１０番地 Kanagawa, 〒2360004, JP)
MOTEGI, Takahiro (3-10, Fukuura, Kanazawa-ku, Yokohama-sh, Kanagawa 04, 〒2360004, JP)

G01R1/067; G01R1/073; G01R31/26; H01R33/76

SAKAI, Hiroaki (Sakai International Patent Office, Kasumigaseki Building 2-5, Kasumigaseki 3-chome, Chiyoda-k, Tokyo 20, 〒1006020, JP)

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