Title:
CONTACT PROBE AND PROBE UNIT
Document Type and Number:
WIPO Patent Application WO/2012/118026
Kind Code:
A1
Abstract:
This probe unit is provided with a substantially flat board-like probe (20) that has: a first contact section, which has a side surface that is bent in an arc, and which has the side surface in contact with one substrate; a second contact section, which has a side surface that is bent in an arc, and which has the side surface in contact with the other substrate; a connecting section, which connects the first contact section and the second contact section with each other; and an elastic section, which is positioned between a first flat surface in contact with the first connecting section by extending from the connecting section, and a second flat surface in contact with the second contact section by being parallel to the first flat surface, and which is elastically deformed due to a load applied to the first contact section and the second contact section. The probe unit is also provided with a probe holder (10), which holds the probe (20).
Inventors:
MOTEGI TAKAHIRO (JP)
Application Number:
PCT/JP2012/054813
Publication Date:
September 07, 2012
Filing Date:
February 27, 2012
Export Citation:
Assignee:
NHK SPRING CO LTD (JP)
MOTEGI TAKAHIRO (JP)
MOTEGI TAKAHIRO (JP)
International Classes:
G01R1/067; G01R31/26
Foreign References:
| JP2000156268A | 2000-06-06 | |||
| JP2004259486A | 2004-09-16 | |||
| JPH08321368A | 1996-12-03 | |||
| JPH06289097A | 1994-10-18 |
Attorney, Agent or Firm:
SAKAI, HIROAKI (JP)
Hiroaki Sakai (JP)
Hiroaki Sakai (JP)
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