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Patent Searching and Data


Title:
CONTACT PROBE
Document Type and Number:
WIPO Patent Application WO/2015/068222
Kind Code:
A1
Abstract:
[Problem] Provided is a contact probe that can be easily handled and that can be substituted without socket development and manufacturing costs. [Solution] A contact probe composed of a coil spring and a pair of electroconductive vertical members, wherein the pair of electroconductive side members comprises a contact part for bringing head parts into contact with an electrode or a signal terminal of a wiring substrate, a flange part provided at an intermediate point along the vertical direction of the contact part, a plate-shaped extension part extending downward from the contact part along a center line, and a pawl part protruding from the vicinity of the distal end of the extension part to the center line, the extension part including a side surface having a sloped surface sloping from an intermediate point to the center line side, the pair of electroconductive vertical members being combined in a mode facing the direction in which the head parts oppose each other, and the coil spring being disposed coaxially with the contact part between the flanges to urge the pair of electroconductive vertical members in a mutually opposing direction, and the pawl part making sliding contact with the sloped surface.

Inventors:
NAKAMURA KOHEI (JP)
FURUTA KAYO (JP)
Application Number:
PCT/JP2013/079994
Publication Date:
May 14, 2015
Filing Date:
November 06, 2013
Export Citation:
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Assignee:
RIKA DENSHI CO LTD (JP)
International Classes:
G01R1/067
Foreign References:
JP2011033410A2011-02-17
JP2009122085A2009-06-04
JP2012068134A2012-04-05
JP2011043731A2011-03-03
JP2013029431A2013-02-07
JP2008025833A2008-02-07
Attorney, Agent or Firm:
YOSHINAGA JUNICHI (JP)
Junichi Yoshinaga (JP)
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