Title:
CONTAMINATION EVALUATION METHOD, CONTAMINATION EVALUATING DEVICE, OPTICAL MEMBER FABRICATING METHOD, OPTICAL MULTILAYER BODY, AND DISPLAY PRODUCT
Document Type and Number:
WIPO Patent Application WO/2008/029946
Kind Code:
A1
Abstract:
A contamination evaluation method and device for quantitatively determining contamination
applicable to various members, having a high reproducibility, and enabling
detection of a slight contamination difference, an optical member fabricating
method, an optical multilayer body having fingerprint attachment prevention,
contamination resistance, and recovery from contamination, and a display product
having this optical multilayer body are provided. By the contamination evaluation
method, a test piece is irradiated with light, diffused light reflected from
or transmitted through the test piece is detected, and the degree of contamination of
the surface of the test piece is evaluated.
Inventors:
ITOH, Kiyoshi (1-1, Ichigaya-kaga-cho 1-chome, Shinjuku-k, Tokyo 01, 1628001, JP)
Application Number:
JP2007/067610
Publication Date:
March 13, 2008
Filing Date:
September 10, 2007
Export Citation:
Assignee:
DAI NIPPON PRINTING CO., LTD. (1-1 Ichigaya-kaga-cho 1-chome, Shinjuku-ku Tokyo, 01, 1628001, JP)
大日本印刷株式会社 (〒01 東京都新宿区市谷加賀町一丁目１番１号 Tokyo, 1628001, JP)
大日本印刷株式会社 (〒01 東京都新宿区市谷加賀町一丁目１番１号 Tokyo, 1628001, JP)
International Classes:
G01N21/94; G01N21/88
Attorney, Agent or Firm:
YASUTOMI, Yasuo et al. (MT-2 BLDG, 5-36 Miyahara 3-chome,Yodogawa-ku, Osaka-sh, Osaka 03, 5320003, JP)
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