Title:
CONTINUITY INSPECTION APPARATUS AND CONTINUITY INSPECTION METHOD
Document Type and Number:
WIPO Patent Application WO/2013/035357
Kind Code:
A1
Abstract:
[Problem] The purpose of the present invention is to provide a continuity inspection apparatus and a continuity inspection method whereby an occurrence of disconnection in a multiple wiring pattern can be reliably detected at low cost. [Solution] A continuity inspection apparatus (100) has a first terminal, a second terminal, and a plurality of wiring lines that electrically connect the first and the second terminals to each other, and performs continuity inspection of a multiple wiring pattern. The continuity inspection apparatus is provided with: an inductance measuring unit (110), which measures an inductance value between the first terminal and the second terminal; a continuity determining unit (120), which compares the inductance value and a predetermined continuity determining threshold value with each other, and on the basis of the results, which determines that disconnection occurred in the multiple wiring pattern if the inductance value is larger than the continuity determining threshold value, and determines that there is no disconnection occurred if the inductance value is not larger than the continuity determining threshold value; a storage unit (130) that stores the continuity determining threshold value; and a display unit (140) that displays results determined by means of the continuity determining unit (120).
Inventors:
TAKANO SHOJI (JP)
MATSUDA FUMIHIKO (JP)
MATSUDA FUMIHIKO (JP)
Application Number:
PCT/JP2012/055068
Publication Date:
March 14, 2013
Filing Date:
February 29, 2012
Export Citation:
Assignee:
NIPPON MEKTRON KK (JP)
TAKANO SHOJI (JP)
MATSUDA FUMIHIKO (JP)
TAKANO SHOJI (JP)
MATSUDA FUMIHIKO (JP)
International Classes:
G01R31/58; H05K3/00
Foreign References:
JP2005223227A | 2005-08-18 | |||
JP2002202335A | 2002-07-19 | |||
JP2002014132A | 2002-01-18 | |||
JPS5919869A | 1984-02-01 | |||
JPH02293674A | 1990-12-04 |
Attorney, Agent or Firm:
KATSUNUMA Hirohito et al. (JP)
Katsunuma Hirohito (JP)
Katsunuma Hirohito (JP)
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