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Patent Searching and Data


Title:
CONTROL SYSTEM, INFORMATION PROCESSING METHOD, AND INFORMATION PROCESSING DEVICE
Document Type and Number:
WIPO Patent Application WO/2023/053511
Kind Code:
A1
Abstract:
The present invention provides a mechanism with which it is possible to flexibly customize a calculation process for a feature amount for use in abnormality detection in accordance with a monitoring target. This control system includes: a control device having a PLC engine for executing control calculation in accordance with a user program and an abnormality detection engine for referring to a trained model and detecting, on the basis of a feature amount calculated from information collected from a control target, an abnormality generated in the control target; a model generation unit for generating the trained model from time-series data of information collected from the control target; a code generation unit for generating, from the information collected from the control target, a feature amount calculation code including a command for calculating a feature amount to be inputted to the trained model; and a program development unit for generating the user program from a project that includes the feature amount calculation code.

Inventors:
KAWANOUE SHINSUKE (JP)
TSUCHIKAWA KENTO (JP)
Application Number:
PCT/JP2022/012284
Publication Date:
April 06, 2023
Filing Date:
March 17, 2022
Export Citation:
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Assignee:
OMRON TATEISI ELECTRONICS CO (JP)
International Classes:
G05B23/02
Foreign References:
JP2020047016A2020-03-26
JP2018097662A2018-06-21
JP2020047041A2020-03-26
JP2020067786A2020-04-30
JP2019159697A2019-09-19
Attorney, Agent or Firm:
FUKAMI PATENT OFFICE, P.C. (JP)
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