Title:
CONTROL SYSTEM INSPECTION DEVICE
Document Type and Number:
WIPO Patent Application WO/2014/174656
Kind Code:
A1
Abstract:
The objective of the present invention is to provide a control system inspection device that can comprehensively inspect the safety of a control system in a variety of hypothetical states. The control system inspection device inspects the safety of a control system, and is characterized by being provided with: a simulator that, on the basis of predetermined conditions, simulates a plant that mocks up an inspection subject, and externally outputs the simulation results; and a model inspection tool that, on the basis of the simulation results and by means of a validation model, next generates information pertaining to states that the plant can assume, and outputs the result to the simulator. The control system inspection device is further characterized in that the predetermined conditions of the simulator are set on the basis of the aforementioned information.
Inventors:
ISHIGOKA TASUKU (JP)
Application Number:
PCT/JP2013/062320
Publication Date:
October 30, 2014
Filing Date:
April 26, 2013
Export Citation:
Assignee:
HITACHI LTD (JP)
International Classes:
G05B23/02
Foreign References:
| JPH10214112A | 1998-08-11 | |||
| JP2009157669A | 2009-07-16 | |||
| JP2012037788A | 2012-02-23 | |||
| JP2011161947A | 2011-08-25 | |||
| JP2011161947A | 2011-08-25 |
Other References:
See also references of EP 2990899A4
Attorney, Agent or Firm:
INOUE Manabu et al. (JP)
Manabu Inoue (JP)
Manabu Inoue (JP)
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