CONTROL SYSTEM, CONTROL METHOD, LEARNING DEVICE, CONTROL DEVICE, LEARNING METHOD, AND LEARNING PROGRAM

Title:

CONTROL SYSTEM, CONTROL METHOD, LEARNING DEVICE, CONTROL DEVICE, LEARNING METHOD, AND LEARNING PROGRAM

Document Type and Number:

WIPO Patent Application WO/2019/235018

Kind Code:

A1

Abstract:

A technology for performing prediction control by which performance of a prediction model can be sufficiently exerted. A control system according to an aspect of the present invention estimates a numerical value range within which a command value can fall from a distribution of second data relating to the command value in a learning data set used to construct a prediction model, and in such a manner that a first acceptable range prescribed by a preset first threshold value with respect to a command value for a subject device is extended, decides a second threshold value with respect to the command value for the subject device on the basis of the estimated numerical value range. Further, in an operational phase, on the basis of an output value from the prediction model, the control system decides a command value for the subject device within a second acceptable range prescribed by the decided second threshold value, and controls an operation of the subject device on the basis of the decided command value.

Inventors:

ABE YASUAKI (JP)
UEYAMA YUKI (JP)
FUJII TAKASHI (JP)
IMATAKE KAZUHIKO (JP)

Application Number:

PCT/JP2019/010189

Publication Date:

December 12, 2019

Filing Date:

March 13, 2019

Export Citation:

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Assignee:

OMRON TATEISI ELECTRONICS CO (JP)

International Classes:

G05B13/02; G05B13/04; G06N20/00

Foreign References:

JP2017102613A	2017-06-08
JPH0863203A	1996-03-08
JPH0988685A	1997-03-31
JP2000099107A	2000-04-07

Other References: