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Title:
CONTROL SYSTEM, PROGRAMMABLE LOGIC CONTROLLER, METHOD, AND PROGRAM
Document Type and Number:
WIPO Patent Application WO/2020/166004
Kind Code:
A1
Abstract:
A control system (1) includes: an information processing device (200) that supplies diagnostic parameters used for the application of diagnostic rules for diagnosing FA devices (601, 602, 603); and a PLC (100) for diagnosing and controlling the FA devices (601, 602, 603). A rule supply unit (260) for the information processing device (200) supplies diagnostic parameters to the programmable logic controller. A program storage unit (130) in the PLC (100) stores control programs that: include diagnostic function blocks for achieving diagnostic processing functions; and are for executing processing that controls the FA devices (601, 602, 603). An execution unit (180) in the PLC (100) diagnoses the FA devices (601, 602, 603) and controls the FA devices (601, 602, 603) according to the diagnostic results, by executing a control program that includes a diagnostic function block having diagnostic parameters set.

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Inventors:
NASU OSAMU (JP)
WATANABE DAISUKE (JP)
Application Number:
PCT/JP2019/005342
Publication Date:
August 20, 2020
Filing Date:
February 14, 2019
Export Citation:
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Assignee:
MITSUBISHI ELECTRIC CORP (JP)
International Classes:
G05B19/05; G05B13/02; G05B23/02
Foreign References:
US20040153172A12004-08-05
JPH03149604A1991-06-26
JPH05313710A1993-11-26
JP2015087897A2015-05-07
JP2002189507A2002-07-05
JP2018097839A2018-06-21
Attorney, Agent or Firm:
KIMURA Mitsuru (JP)
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