Title:
CONTROL TEST DEVICE AND CONTROL TEST METHOD
Document Type and Number:
WIPO Patent Application WO/2018/051506
Kind Code:
A1
Abstract:
The purpose of the present invention is to provide technology for suppressing excessive determinations that control of a display control device is abnormal. Provided is a control test device comprising an acquisition unit and a control unit. The control unit constantly determines, on the basis of a second image output from a display control device and first test data acquired by the acquisition unit, whether control by the display control device over a display device is abnormal. The control unit stops making determinations until a predetermined amount of time elapses from a first time point, such predetermined amount of time being equal to or greater than the amount of time from the first time point at which the first test data is input to the control unit until a second time point at which the second image is input to the control unit.
Inventors:
TANAKA KOHEI (JP)
WAKAYANAGI HARUHIKO (JP)
SHIMOTANI MITSUO (JP)
WAKAYANAGI HARUHIKO (JP)
SHIMOTANI MITSUO (JP)
Application Number:
PCT/JP2016/077546
Publication Date:
March 22, 2018
Filing Date:
September 16, 2016
Export Citation:
Assignee:
MITSUBISHI ELECTRIC CORP (JP)
International Classes:
B60K35/00; H04N17/04; B60K37/06; G09G3/20; G09G5/00
Foreign References:
| JP2012035677A | 2012-02-23 | |||
| JPH1188585A | 1999-03-30 | |||
| JP2005079631A | 2005-03-24 | |||
| JPH09113221A | 1997-05-02 | |||
| JP2009135684A | 2009-06-18 |
Attorney, Agent or Firm:
YOSHITAKE Hidetoshi et al. (JP)
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