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Title:
COOKING BY UTILIZING A CLUSTER ANALYSIS AND COOKING UTENSILS THEREFOR
Document Type and Number:
WIPO Patent Application WO2004062372
Kind Code:
A3
Abstract:
The invention relates to a method for cooking items that are to be cooked in a cooking chamber of a cooking utensil comprising a control and/or regulating mechanism which has access to primary, chronologically arranged measured data and secondary measured data of a state variable regarding at least one item that is to be cooked and/or a state variable regarding a cooking utensil, said secondary measured data not being chronologically arranged. The cooking process is carried out in the following steps according to said state variable/s: an actual cooking curve of the measured data Zi of the item (i) that is to be cooked is detected up to a specific point in time tM before the final cooking point tE is reached; the detected actual cooking curve Zi is associated with a representative cooking profile Xn that is determined via a cluster analysis; and the cooking process is carried out according to the determined representative cooking profile Xn, wherein i and n ELEMENT |N. Also disclosed is a cooking utensil comprising a cooking chamber for receiving items that are to be cooked, a measuring device for detecting measuring data, a device for storing measured data and variables that are determined therefrom, and a control and/or regulating mechanism for directing the cooking process according to the inventive method.

Inventors:
BLASCHKE GUENTER (DE)
Application Number:
PCT/DE2004/000003
Publication Date:
September 30, 2004
Filing Date:
January 07, 2004
Export Citation:
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Assignee:
RATIONAL AG (DE)
BLASCHKE GUENTER (DE)
International Classes:
G05B15/02; G05B23/02; (IPC1-7): G05B23/02
Foreign References:
DE19718399A11998-11-05
US6202038B12001-03-13
EP1170650A12002-01-09
EP0271380A11988-06-15
Other References:
PATTIPATI K R ET AL: "CONFIDANTE: A COMPUTER-BASED DESIGN AID FOR THE OPTIMAL SYNTHESIS, ANALYSIS AND OPERATION OF MAINTENANCE FACILITIES", PROCEEDINGS OF THE INTERNATIONAL AUTOMATIC TESTING CONFERENCE. (AUTOTESTCON). WASHINGTON, NOV. 5 - 7, 1984, PROCEEDINGS OF THE INTERNATIONAL AUTOMATIC TESTING CONFERENCE. (AUTOTESTCON). FROM 1990: SYSTEMS READINESS TECHNOLOGY CONFERENCE, NEW YORK, IE, vol. CONF. 20, 1 November 1984 (1984-11-01), pages 390 - 404, XP000745700
POSTAIRE J G ET AL: "CLUSTER ANALYSIS BY BINARY MORPHOLOGY", IEEE TRANSACTIONS ON PATTERN ANALYSIS AND MACHINE INTELLIGENCE, IEEE INC. NEW YORK, US, vol. 15, no. 2, 1 February 1993 (1993-02-01), pages 170 - 180, XP000348902, ISSN: 0162-8828
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