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Title:
CORRECTION DEVICE, SYSTEM, METHOD, AND PROGRAM
Document Type and Number:
WIPO Patent Application WO/2023/007846
Kind Code:
A1
Abstract:
Provided are a correction device, a correction system, a correction method, and a correction program with which it is possible to reduce calculation cost for correcting an artifact due to a beam-hardening effect in reconstruction of a CT image. A correction device 400 for correcting an artifact due to a beam-hardening effect in reconstruction of a CT image, comprises: an incident X-ray distribution acquisition unit 410 that acquires an incident X-ray distribution; a linear absorption coefficient model acquisition unit 420 for acquiring a linear absorption coefficient model in which energy dependence of a linear absorption coefficient is expressed by a scale factor including a parameter; a projected image acquisition unit 430 that acquires a projected image; and a correction unit 440 that corrects the projected image by using the incident X-ray distribution and the linear absorption coefficient model.

Inventors:
OTA TAKUMI
Application Number:
PCT/JP2022/014455
Publication Date:
February 02, 2023
Filing Date:
March 25, 2022
Export Citation:
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Assignee:
RIGAKU DENKI CO LTD (JP)
International Classes:
G01N23/046; G01T7/00
Domestic Patent References:
WO2016002034A12016-01-07
WO2014192889A12014-12-04
Foreign References:
JP2011203160A2011-10-13
JP2018515160A2018-06-14
JP2017221339A2017-12-21
US20150212015A12015-07-30
Attorney, Agent or Firm:
FUKUCHI Takeo (JP)
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