Title:
CORRELATED MICROSCOPE
Document Type and Number:
WIPO Patent Application WO/2017/057729
Kind Code:
A1
Abstract:
According to the present invention, a first region extraction window (37) including an image of one sample platform (6) and the observation target tissue (35) of a sample (7) when respectively positioned on two microscopes (1, 2), first sample platform coordinates (31), second sample platform coordinates (32), and the coordinates of a second region extraction window (38) are acquired, the second sample platform coordinates are corrected on the basis of the difference between the first sample platform coordinates and the second sample platform coordinates, to acquire the coordinates of the second region extraction window after correction, and a second positioning unit is moved from a second non-observation position to a second observation position in which the second region extraction window is located at a positon corresponding to the coordinate position of the first region extraction window on the basis of the corrected coordinates.
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Inventors:
ISOBE SHINICHIRO (JP)
KANEMARU TAKAAKI (JP)
TAKASU SHIN-ICHI (JP)
KOSAKA KOJI (JP)
OE TAKASHI (JP)
KANEMARU TAKAAKI (JP)
TAKASU SHIN-ICHI (JP)
KOSAKA KOJI (JP)
OE TAKASHI (JP)
Application Number:
PCT/JP2016/079121
Publication Date:
April 06, 2017
Filing Date:
September 30, 2016
Export Citation:
Assignee:
NAKAMURA SANGYO GAKUEN (JP)
INT SCIENCE TECH CO LTD (JP)
TCK INC (JP)
INT SCIENCE TECH CO LTD (JP)
TCK INC (JP)
International Classes:
G02B21/26; G01N23/225; H01J37/16; H01J37/20; H01J37/22
Foreign References:
JPH0541194A | 1993-02-19 | |||
JPH0427908A | 1992-01-30 | |||
JP2003140053A | 2003-05-14 | |||
JP2012009247A | 2012-01-12 | |||
JPS5590046A | 1980-07-08 |
Attorney, Agent or Firm:
SAMEJIMA, Mutsumi et al. (JP)
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