Login| Sign Up| Help| Contact|

Patent Searching and Data


Title:
COSMETIC MATERIAL THICKNESS MEASURING DEVICE AND METHOD
Document Type and Number:
WIPO Patent Application WO/2018/221923
Kind Code:
A1
Abstract:
The present invention relates to a cosmetic material thickness measuring device and thickness measuring method, and the cosmetic material thickness measuring device, according to one embodiment of the present invention, comprises: an extinction coefficient calculating unit for calculating an extinction coefficient of a test cosmetic material; an internal reflective light measuring unit for measuring the intensity of internal reflective light prior to the application of the test cosmetic material to target skin and the intensity of internal reflective light after the application of the test cosmetic material to the target skin; and a thickness calculating unit for calculating the thickness of the test cosmetic material according to Lambert's law on the basis of the calculated extinction coefficient and the intensity of reflective light prior to and after the application of the test cosmetic material.

Inventors:
LEE MYEONGRYEOL (KR)
KIM EUN JOO (KR)
YEON YEONGMIN (KR)
LEE HAEKWANG (KR)
Application Number:
PCT/KR2018/006067
Publication Date:
December 06, 2018
Filing Date:
May 29, 2018
Export Citation:
Click for automatic bibliography generation   Help
Assignee:
AMOREPACIFIC CORP (KR)
International Classes:
G01B11/06; A61B5/00; G06F17/10
Foreign References:
JP2007278880A2007-10-25
US6573999B12003-06-03
JP2007256021A2007-10-04
US5506407A1996-04-09
JP2001242075A2001-09-07
Attorney, Agent or Firm:
KIM, Sun-young (KR)
Download PDF: