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Patent Searching and Data


Title:
CRACK ANALYZER, CRACK ANALYSIS METHOD, AND CRACK ANALYSIS PROGRAM
Document Type and Number:
WIPO Patent Application WO/2017/014288
Kind Code:
A1
Abstract:
A crack analyzer, having a photographic image acquisition unit, a crack detection unit, and a crack ratio calculation unit. The photographic image acquisition unit acquires a photographic image obtained by photographing a road surface. The crack detection unit detects cracking of the photographed road surface on the basis of the photographic image. The crack ratio calculation unit calculates the crack ratio on the basis of the cracking, the crack ratio indicating the proportion of the crack area in a predetermined area.

Inventors:
YONEKAWA YOKO (JP)
KUMAKURA NOBUYUKI (JP)
YAMAZAKI TAKAHIKO (JP)
YASUNAMI SHINGO (JP)
Application Number:
PCT/JP2016/071455
Publication Date:
January 26, 2017
Filing Date:
July 21, 2016
Export Citation:
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Assignee:
TOSHIBA KK (JP)
International Classes:
E01C23/01; G01B11/30; G01N21/88
Foreign References:
JP2008046065A2008-02-28
JPH0996515A1997-04-08
Other References:
TOSHIBA, TOSHIBA NEWS & TOPICS, 29 June 2015 (2015-06-29), XP009508442
MINISTRY OF LAND, INFRASTRUCTURE, TRANSPORT AND TOURISM ROAD BUREAU: "So Tenken Jisshi Yoryo(An) [Hoso Hen] (Sanko Shiryo", SANKO-2 KISOTEKI DATA NO HAAKU, February 2013 (2013-02-01), pages 2, XP009508481
See also references of EP 3327198A4
Attorney, Agent or Firm:
SHIGA INTERNATIONAL PATENT OFFICE (JP)
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