Title:
CRACK INSPECTION DEVICE FOR STRUCTURE
Document Type and Number:
WIPO Patent Application WO/2022/039332
Kind Code:
A1
Abstract:
The present invention relates to a crack inspection device for a structure and, more specifically, to a device for inspecting cracks in a structure such as a bridge pier or a building. The crack inspection device for a structure, according to an embodiment of the present invention, can move up and down along a structure for which crack inspection is to be performed, and can inspect cracks regardless of the height of the structure.
Inventors:
CHOI JONG DAI (KR)
Application Number:
PCT/KR2020/018311
Publication Date:
February 24, 2022
Filing Date:
December 15, 2020
Export Citation:
Assignee:
CHOI JONG DAI (KR)
International Classes:
G01B21/32; B25J9/00; B25J9/10; B25J19/02; G01B7/16; G01B11/16; G01B17/04
Foreign References:
| KR102123189B1 | 2020-06-15 | |||
| KR20110132780A | 2011-12-09 | |||
| KR20120088244A | 2012-08-08 | |||
| KR102011392B1 | 2019-08-16 | |||
| KR20040101158A | 2004-12-02 |
Attorney, Agent or Firm:
JIDAM IP LAW FIRM (KR)
Download PDF: