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Patent Searching and Data


Title:
CT SYSTEM PARAMETER DETERMINING METHOD AND DEVICE
Document Type and Number:
WIPO Patent Application WO/2019/000234
Kind Code:
A1
Abstract:
A CT system parameter determining method and device (1, 140), relating to the technical field of computer imaging. The CT system parameter determining method comprises: controlling a model body (M) having a first plane (A1) and a second plane (B1) perpendicular to each other to move between an X-ray source (01) and a detection surface (Y) of a detector (02), and acquiring an X-ray projection of the model body (M) on the detection surface (Y) during movement (301), wherein during the movement of the model body (M), the first plane (A1) and the second plane (B1) are always perpendicular to the detection surface (Y); determining a first straight line (Lu) and a second straight line (Lv) according to the acquired X-ray projection (302); and determining coordinates of an intersection (O') of the first straight line (Lu) and the second straight line (Lv) as coordinates of the foot of the perpendicular from the focus (S) of the X-ray source (01) to the detection surface (Y), wherein CT system parameters comprise coordinates of the foot of the perpendicular. The method solves the problem that a manufacturing process of a model body (M) is complex, simplifies the manufacturing process of the model body (M), and is used for determining CT system parameters.

Inventors:
YAN HAO (CN)
WANG WEN (CN)
LI JINSHENG (CN)
Application Number:
PCT/CN2017/090378
Publication Date:
January 03, 2019
Filing Date:
June 27, 2017
Export Citation:
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Assignee:
SHENZHEN OUR NEW MEDICAL TECH DEVELOPMENT CO LTD (CN)
International Classes:
A61B6/03; G01B11/03
Foreign References:
CN101750021A2010-06-23
CN105931202A2016-09-07
CN106706675A2017-05-24
CN102652674A2012-09-05
US7170966B22007-01-30
US5872829A1999-02-16
Attorney, Agent or Firm:
BEIJING SAN GAO YONG XIN INTELLECTUAL PROPERTY AGENCY CO., LTD. (CN)
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