CURRENT DETECTION CIRCUIT AND SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE

WIPO Patent Application WO/2013/094148

A1

A current detection circuit, wherein a first circuit (CB) is connected between a first terminal and a second terminal, and a second circuit (CA) is connected between a third terminal and a fourth terminal. The second terminal and fourth terminal are in a common connection with one another. When a first current flows between the first terminal and the second terminal, a voltage drop occurs in the first circuit. A current control circuit (CC) controls the first current in the first circuit such that the applied voltage across the first terminal and second terminal of the first circuit is substantially the same voltage as the applied voltage across the third terminal and fourth terminal of the second circuit, in accordance with the magnitude of the second current in the second circuit. When the voltage drop in the first circuit is the same as the voltage drop occurring in the second circuit, the first current flowing between the first terminal and second terminal is a current magnitude proportional to the second current of the second circuit. A detection circuit (S) detects the current flowing between the first terminal and the third terminal by detecting the first current of the first circuit controlled by the current control circuit, or the second current of the second circuit.

YAGYU KEISUKE (JP)
UMETANI KAZUHIRO (JP)

PCT/JP2012/007889

June 27, 2013

December 11, 2012

Click for automatic bibliography generation  

DENSO CORP (JP)

G01R19/00; G05F1/10; G05F3/26; H02M1/00

JP2000235424A	2000-08-29
JP2009291057A	2009-12-10
JP2011095146A	2011-05-12
JPH1183911A	1999-03-26
JP2000180478A	2000-06-30
JP2007241411A	2007-09-20
JP2007195006A	2007-08-02
JP2004140423A	2004-05-13

KIN, Junhi (JP)
Gold Junki (JP)

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