Title:
DAMAGE PREDICTION APPARATUS AND DAMAGE PREDICTION METHOD FOR POWER SEMICONDUCTOR SWITCHING ELEMENT, AC-DC CONVERTER, AND DC-DC CONVERTER
Document Type and Number:
WIPO Patent Application WO/2018/168328
Kind Code:
A1
Abstract:
According to the present invention, a damage determination apparatus for a power semiconductor switching element is provided with: a resistor that is connected to the gate of the power semiconductor switching element; a comparison unit that compares a reference voltage with a detected voltage in accordance with the voltage generated at both ends of the resistor, when a prescribed voltage is applied to the gate of the power semiconductor switching element; and a prediction unit that predicts that a prescribed damage has accumulated in the gate insulating layer of the power semiconductor switching element when the detected voltage exceeds the reference voltage.
Inventors:
IKEDA HIDETOSHI (JP)
TOGAWA TAKASHI (JP)
TOGAWA TAKASHI (JP)
Application Number:
PCT/JP2018/005532
Publication Date:
September 20, 2018
Filing Date:
February 16, 2018
Export Citation:
Assignee:
NIDEC CORP (JP)
International Classes:
G01R31/26; H02M3/155; H02M7/12
Foreign References:
JP2003143833A | 2003-05-16 | |||
JP2005217774A | 2005-08-11 | |||
JP2000023452A | 2000-01-21 | |||
JP2008042317A | 2008-02-21 | |||
JP2007174756A | 2007-07-05 | |||
JP2000308250A | 2000-11-02 | |||
JP2007202238A | 2007-08-09 | |||
JP5186095B2 | 2013-04-17 |
Other References:
See also references of EP 3598155A4
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