DAMPER TESTING DEVICE

WIPO Patent Application WO/2010/050121

A1

A damper testing device which is simply configured, which can be easily adjusted in position according to a change in the amplitude of vibration to be applied to a damper and to the size of the damper, and which allows a test of the damper to be easily set up.  A damper testing device (1) is provided with a base body section (3) supported on a foundation (2), a motor (4) provided to one end of the base body section (3), a rotating shaft (5) provided inside the base body section (3) and having one end connected to the motor (4), a movable member (6) engaged with the rotating shaft (5) and moved by converting a rotational motion of the rotating shaft (5) into a linear reciprocating motion in the direction of the rotating shaft (5), a first holding member (8) connected to the movable member (6) and supporting one end of a movable section (7a) of a damper (7), a second holding member (9) provided to the base body section (3) and supporting a body (7b) of the damper (7), a load detector (12) mounted to the movable member, and a displacement detector (13) provided to the other end side of the base body section (3).

HAYASHI, Akio (3-3 Takatsukadai 7-chome, Nishi-ku, Kobe-sh, Hyogo 71, 〒6512271, JP)
林章夫 (〒71 兵庫県神戸市西区高塚台７丁目３番地の３ナブテスコ株式会社神戸工場内 Hyogo, 〒6512271, JP)

JP2009/005080

May 06, 2010

October 01, 2009

Click for automatic bibliography generation  

NABTESCO CORPORATION (9-18, Kaigan 1-chome Minato-k, Tokyo 22, 〒1050022, JP)
ナブテスコ株式会社 (〒22 東京都港区海岸一丁目９番１８号 Tokyo, 〒1050022, JP)
HAYASHI, Akio (3-3 Takatsukadai 7-chome, Nishi-ku, Kobe-sh, Hyogo 71, 〒6512271, JP)

G01M7/02

CREIA IP ATTORNEYS (Dojima Building, 2-6-8 NishitenmaKita-ku, Osaka-shi, Osaka 47, 〒5300047, JP)

View/Download PDF      PDF Help

Previous Patent: SILICON WAFER MANUFACTURING METHOD

Next Patent: HIGH-FREQUENCY WAVEGUIDE AND PHASE SHIFTER USING SAME, RADIATOR, ELECTRONIC DEVICE WHICH USES THIS P...