Title:
DATA CHANNEL AGING CIRCUIT, MEMORY AND AGING METHOD
Document Type and Number:
WIPO Patent Application WO/2020/078265
Kind Code:
A1
Abstract:
A data channel aging circuit, a memory, a data channel aging method, and a memory aging method are provided. The data channel aging circuit includes: a memory cell storing a voltage switching signal configured to provide a target voltage state for each of a plurality of data channels in an integrated circuit (IC); a control unit configured to generate a voltage control signal and to send the voltage control signal to each data channel; and a strobe unit configured to switch a conductive state of each data channel based on the voltage switching signal, and to adjust a voltage level of each data channel through the voltage control signal to induce voltage stress aging. The data channel aging circuit improves the reliability of the aging test and the operational stability of the IC products that have went through the aging test.
Inventors:
CHEN YUNG-SHIUAN (CN)
Application Number:
PCT/CN2019/110551
Publication Date:
April 23, 2020
Filing Date:
October 11, 2019
Export Citation:
Assignee:
CHANGXIN MEMORY TECH INC (CN)
International Classes:
G11C29/50
Foreign References:
| CN109087684A | 2018-12-25 | |||
| CN208834751U | 2019-05-07 | |||
| US20070147146A1 | 2007-06-28 | |||
| US20030081490A1 | 2003-05-01 | |||
| CN201436591U | 2010-04-07 |
Attorney, Agent or Firm:
SHANGHAI SAVVY INTELLECTUAL PROPERTY AGENCY (CN)
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