Title:
DATA INSPECTION METHOD AND DEVICE IN SOLID STATE MEMORY
Document Type and Number:
WIPO Patent Application WO/2017/193967
Kind Code:
A1
Abstract:
A data inspection method and device in a solid state memory, relating to the technical field of storage. The method comprises: reading, in a current inspection cycle and according to the time when a memory block mounted in a first linked list group is mounted in the first linked list group, a valid data page stored in the memory block mounted in the first linked list group (201); storing the read valid data page into an enabled memory block, the enabled memory block being a blank memory block used for a data page to be written to (202); mounting the enabled memory block enabled in the inspection cycle to a second linked list group according to the time when the enabled memory block is enabled (203); and when a next inspection cycle of the current inspection cycle starts, using the second linked list group as a first linked list group, and using the first linked list group as a second linked list group (204). On the basis of optimization of data stability, the method can cohere stable data to some memory blocks, and increase the number of memory blocks that can be used for unstable data, so as to increase the redundancy rate, reduce write amplification and SSD wear, and prolong the service life of the SSD.
Inventors:
WU LIMING (CN)
ZHAO WAN (CN)
HUANG BIN (CN)
YANG XIAO (CN)
WANG YONGLIANG (CN)
ZHAO WAN (CN)
HUANG BIN (CN)
YANG XIAO (CN)
WANG YONGLIANG (CN)
Application Number:
PCT/CN2017/083988
Publication Date:
November 16, 2017
Filing Date:
May 11, 2017
Export Citation:
Assignee:
HUAWEI TECH CO LTD (CN)
International Classes:
G06F12/06
Foreign References:
| CN102768645A | 2012-11-07 | |||
| CN103049713A | 2013-04-17 | |||
| CN101354681A | 2009-01-28 | |||
| US20160011971A1 | 2016-01-14 |
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