Login| Sign Up| Help| Contact|

Patent Searching and Data


Title:
DATA MANAGEMENT PLATFORM, INTELLIGENT DEFECT ANALYSIS SYSTEM, INTELLIGENT DEFECT ANALYSIS METHOD, COMPUTER-PROGRAM PRODUCT, AND METHOD FOR DEFECT ANALYSIS
Document Type and Number:
WIPO Patent Application WO/2022/116107
Kind Code:
A1
Abstract:
A data management platform for intelligently managing data is provided. The data management platform includes an ETL module configured to extract, cleanse, transform, or load data; a data lake configured to store a first group of data formed by extracting raw data from a plurality of data sources by the ETL module; a data warehouse configured to store a second group of data formed by cleansing and standardizing on the first group of data; a general data layer configured to store a third group of data formed by subjecting the second group of data to data fusion; and a data mart configured to store a fourth group of data formed by transforming the third group of data by the ETL module. The general data layer is a distributed data storage storing information available for querying. The data mart is a database of NoSQL type storing information available for computational processing.

Inventors:
YUAN FEI (CN)
WANG HONG (CN)
WU JIANMIN (CN)
SHEN GUOLIANG (CN)
LAN TIAN (CN)
TANG YUE (CN)
WU HAOHAN (CN)
ZENG YINGLI (CN)
WANG JIANZHOU (CN)
BAI GUANCHUN (CN)
Application Number:
PCT/CN2020/133681
Publication Date:
June 09, 2022
Filing Date:
December 03, 2020
Export Citation:
Click for automatic bibliography generation   Help
Assignee:
BOE TECHNOLOGY GROUP CO LTD (CN)
International Classes:
G05B19/418
Foreign References:
CN110276410A2019-09-24
CN107037053A2017-08-11
CN111104394A2020-05-05
CN109739902A2019-05-10
CN111948994A2020-11-17
US20190086905A12019-03-21
Download PDF: