Title:
DATA PROCESSING DEVICE AND DATA PROCESSING METHOD FOR X-RAY INSPECTION, AND X-RAY INSPECTING DEVICE WITH SAID DEVICE MOUNTED THEREIN
Document Type and Number:
WIPO Patent Application WO/2018/212217
Kind Code:
A1
Abstract:
The objective of the present invention is to enhance an interface function for identification processing, with which the result of an identification of the type or the properties of a substance being X-ray inspected does not depend on the observation direction. In a data processing device (12), image data are calculated on the basis of a photon count value of X-rays transmitted through a target object. For example, X-ray attenuation information is set individually for n (where n is a positive integer at least equal to 2) energy regions of the X-ray and for each pixel, on the basis of the image data. The attenuation information includes i) unique information which is represented as a vector quantity in coordinates having the same number n of dimensions as the number of the n energy regions, and which depends uniquely on the type or the properties of the target object, and ii) accompanying information which accompanies the unique information and which depends on the length of a path along which the X-rays pass though the target object. Only unique information which does not depend on the accompanying information is generated from the attenuation information. A scatter plot for mapping a scatter plot corresponding to the unique information onto the n-dimensional coordinates or onto coordinates having a number of dimensions less than n dimensions is calculated.
Inventors:
YAMAKAWA TSUTOMU (JP)
YAMAMOTO SHUICHIRO (JP)
OKADA MASAHIRO (JP)
YAMAMOTO SHUICHIRO (JP)
OKADA MASAHIRO (JP)
Application Number:
PCT/JP2018/018867
Publication Date:
November 22, 2018
Filing Date:
May 16, 2018
Export Citation:
Assignee:
JOB CORP (JP)
International Classes:
G01N23/087; A61B6/00; G01N23/044; G01N23/18
Domestic Patent References:
| WO2016171186A1 | 2016-10-27 | |||
| WO2014126189A1 | 2014-08-21 |
Foreign References:
| JPH08178873A | 1996-07-12 | |||
| JP2011024773A | 2011-02-10 | |||
| US20130110438A1 | 2013-05-02 | |||
| JP2015200649A | 2015-11-12 | |||
| JP2013119000A | 2013-06-17 |
Other References:
See also references of EP 3627145A4
Attorney, Agent or Firm:
SEIRYU Patent Professional Corporation et al. (JP)
Download PDF: