Title:
DATA PROCESSING METHOD, MEASUREMENT SYSTEM, AND PROGRAM
Document Type and Number:
WIPO Patent Application WO/2024/033998
Kind Code:
A1
Abstract:
This data processing method is for analyzing scattered waves from waves emitted to an object and involves: emitting the waves to an object from a plurality of transmission points p1(x'1, y'1, z'1) arrayed on a y-axis; receiving scattered waves, having reflected at a reflection point (x, y, z) on the object at a reflection factor f(x, y, z), at a plurality of reception points p2(x'2, y'2, z'2) arrayed on the y-axis, as measurement values s(x'1, x'2, y'1, y'2, z'1, z'2, k); subjecting the measurement values s(x'1, x'2, y'1, y'2, z'1, z'2, k) to triple Fourier transformation to obtain S(k'x1, k'x2, k'y1, k'y2, z'1, z'2, k); performing a variable substitution process in the x-direction in a range of -kx1≤kx≤kx1 (where kx,nyq≤kx1) when the Nyquist wavenumber in the x-direction determined by a measurement interval in the x-direction is kx,nyq; performing a variable substitution process in the y-direction in ranges of -ky1≤k'y1≤ky1 and -ky2≤k'y2≤ky2 (where k'y1,nyq≤ky1 and k'y2,nyq≤ky2) when the Nyquist wavenumber in a y'1-direction and the Nyquist wavenumber in a y'2-direction, which are determined by a measurement interval in the y-direction, are k'y1,nyq and k'y2,nyq, respectively; performing triple inverse Fourier transformation; and obtaining a reflection factor f(x, y, z).
Inventors:
MORI YASUNARI (JP)
Application Number:
PCT/JP2022/030374
Publication Date:
February 15, 2024
Filing Date:
August 09, 2022
Export Citation:
Assignee:
MITSUI E&S CO LTD (JP)
International Classes:
G01N22/00
Domestic Patent References:
| WO2017149582A1 | 2017-09-08 | |||
| WO2021020387A1 | 2021-02-04 |
Foreign References:
| JP2018138880A | 2018-09-06 | |||
| JP2000193742A | 2000-07-14 |
Attorney, Agent or Firm:
GLOBAL IP TOKYO (JP)
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