Title:
DATA PROCESSING METHOD, MEASUREMENT SYSTEM, AND PROGRAM
Document Type and Number:
WIPO Patent Application WO/2024/034000
Kind Code:
A1
Abstract:
Provided is a data processing method for analyzing scattered waves of waves emitted to an object, wherein: waves are emitted to an object from a plurality of transmission points p1(x'1, y'1, z'1) arranged two-dimensionally on an xy plane; scattered waves reflected with a reflectivity f(x, y, z) at a reflection point (x, y, z) on the object are received, as measurement values s(x'1, x'2, y'1, y'2, z'1, z'2, k), at a plurality of reception points p2(x'2, y'2, z'2) arranged two-dimensionally on the xy plane; a quadruple Fourier transform is performed on the measurement values s(x'1, x'2, y'1, y'2, z'1, z'2, k) to find S(k'x1, k'x2, k'y1, k'y2, z'1, z'2, k); with k'x1,nyq being defined as the Nyquist frequency in the x'1 direction determined by a measurement interval in the x direction, and k'x2,nyq being defined as the Nyquist frequency in the x'2 direction, variable substitution processing in the x direction is performed in the range of -kx1≤k'x1≤kx1 and -kx2≤k'x2≤kx2 (where k'x1,nyq≤kx1 and k'x2,nyq≤kx2); with k'y1,nyq being defined as the Nyquist frequency in the y'1 direction determined by the measurement interval in the y direction, and k'y2,nyq being defined as the Nyquist frequency in the y'2 direction, variable substitution processing in the y direction is performed in the range of -ky1≤k'y1≤ky1 and -ky2≤k'y2≤ky2 (where k'y1,nyq≤ky1 and k'y2,nyq≤ky2); and a triple inverse Fourier transform is performed to find reflectivity f(x, y, z).
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Inventors:
MORI YASUNARI (JP)
Application Number:
PCT/JP2022/030378
Publication Date:
February 15, 2024
Filing Date:
August 09, 2022
Export Citation:
Assignee:
MITSUI E&S CO LTD (JP)
International Classes:
G01N22/00
Domestic Patent References:
| WO2017149582A1 | 2017-09-08 | |||
| WO2021020387A1 | 2021-02-04 |
Foreign References:
| JP2018138880A | 2018-09-06 | |||
| JP2000193742A | 2000-07-14 |
Attorney, Agent or Firm:
GLOBAL IP TOKYO (JP)
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