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Patent Searching and Data


Title:
DEEP METRIC LEARNING-BASED ACCURATE TARGET RETRIEVAL METHOD
Document Type and Number:
WIPO Patent Application WO/2018/137358
Kind Code:
A1
Abstract:
Deep metric learning-based accurate target retrieval method, the method comprising: in the iterative training of a deep neural network structure, enabling the same class of target objects to be close to each other and enabling different classes of target objects to be far away from each other in a process wherein characteristics of multiple extracted pictures of the same class of target object are processed, wherein intra-class individuals having a similar attribute are close to each other in the characteristic distribution of individuals of the same class, and the distance between intra-class individuals having different attributes is greater than a preset distance, so as to obtain a trained deep neural network structure; using a trained deep neural network structure to extract respective characteristics from pictures to be queried and a preset reference picture respectively; and obtaining Euclidean distances of characteristics between the query pictures and the reference picture, and sorting the distances from small to large so as to obtain an accurate retrieval target. With said method, the problem of accurate retrieval in a vertical field is solved.

Inventors:
DUAN LINGYU (CN)
BAI YAN (CN)
LOU YIHANG (CN)
GAO FENG (CN)
Application Number:
PCT/CN2017/104397
Publication Date:
August 02, 2018
Filing Date:
September 29, 2017
Export Citation:
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Assignee:
UNIV BEIJING (CN)
International Classes:
G06F17/30
Foreign References:
CN106897390A2017-06-27
CN105808732A2016-07-27
CN106203242A2016-12-07
CN106022226A2016-10-12
US20070297675A12007-12-27
US20140307958A12014-10-16
Attorney, Agent or Firm:
BEIJING CHEN QUAN INTELLECTUAL PROPERTY LAW FIRM (CN)
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