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Title:
DEFECT ANALYSIS DEVICE, DEFECT ANALYSIS METHOD, AND PROGRAM
Document Type and Number:
WIPO Patent Application WO/2014/050619
Kind Code:
A1
Abstract:
The present invention provides a defect analysis device including: an excitation unit (107) that imparts vibrations of a plurality of frequencies to a fluid (110) flowing through a pipe (108); a first detector (106) that, when the excitation part (107) is imparting vibrations, detects vibrations emanating from the pipe (108); and a signal processing unit (101) that extracts a feature quantity from a vibration waveform acquired by the first detector (106), and uses the extracted feature quantity to estimate the extent of a defect formed in the pipe (108).

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Inventors:
TAKAHASHI MASATAKE (JP)
TOMIYAMA MIZUHO (JP)
SASAKI YASUHIRO (JP)
Application Number:
PCT/JP2013/074927
Publication Date:
April 03, 2014
Filing Date:
September 13, 2013
Export Citation:
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Assignee:
NEC CORP (JP)
International Classes:
G01M3/24
Foreign References:
JPH11142280A1999-05-28
JP2010169626A2010-08-05
JP2001280943A2001-10-10
JPH10281921A1998-10-23
JP2009002873A2009-01-08
JP2000310577A2000-11-07
JPS60238734A1985-11-27
JP2012216890A2012-11-08
Other References:
See also references of EP 2902764A4
Attorney, Agent or Firm:
HAYAMI SHINJI (JP)
Shinji Hayami (JP)
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