Title:
DEFECT CHECKING SYSTEM AND METHOD THEREFOR
Document Type and Number:
WIPO Patent Application WO/2023/101049
Kind Code:
A1
Abstract:
The present invention relates to a defect checking system and a method therefor. The defect checking system may comprise: a control device for transmitting a flight command signal to a drone and receiving a defect detection result of a subject from the drone; the drone for receiving the flight command signal while flying; a gimbal attached to the front of the drone; a camera which is fixed to the gimbal, and which has a field of view that is adjusted according to the driving of the gimbal; and a LiDAR sensor which is fixed to the gimbal and which detects the distance to the subject.
More Like This:
Inventors:
LEE BYUNG YOON (KR)
CHUNG YOUNG SUK (KR)
CHOI JAE HYUK (KR)
CHUNG YOUNG SUK (KR)
CHOI JAE HYUK (KR)
Application Number:
PCT/KR2021/018047
Publication Date:
June 08, 2023
Filing Date:
December 01, 2021
Export Citation:
Assignee:
NEARTHLAB INC (KR)
International Classes:
G01N21/88; B64C39/02; B64D47/00; F03D17/00; G01S17/08; G03B15/00; G03B17/56; G05D1/00; G06Q50/10
Foreign References:
| KR20170104762A | 2017-09-18 | |||
| KR102038097B1 | 2019-10-29 | |||
| JP2018181235A | 2018-11-15 | |||
| KR20190120399A | 2019-10-23 | |||
| US20180003161A1 | 2018-01-04 |
Attorney, Agent or Firm:
KAI INTERNATIONAL IP LAW FIRM (KR)
Download PDF: