Title:
DEFECT DETECTION DEVICE AND DEFECT DETECTION METHOD USING SAME
Document Type and Number:
WIPO Patent Application WO/2018/182103
Kind Code:
A1
Abstract:
The present invention relates to a defect detection device and a defect detection method using same and, more specifically, to a defect detection device for detecting a defect in an object under inspection, and a defect detection method using the device. The defect detection device according to an embodiment of the present invention comprises: a first probe unit for transmitting a signal into an object under inspection and receiving a signal generated inside the object under inspection; a second probe unit installed away from the first probe unit and receiving a signal generated inside the object under inspection; and a location determination unit for determining the location of a defect in the object under inspection by using a signal received from the first probe unit and a signal received from the second probe unit.
Inventors:
SHIN DONG HWAN (KR)
SHIN YE JI (KR)
CHA SEUNG EUN (KR)
SHIN YE JI (KR)
CHA SEUNG EUN (KR)
Application Number:
PCT/KR2017/008552
Publication Date:
October 04, 2018
Filing Date:
August 08, 2017
Export Citation:
Assignee:
SHIN DONG HWAN (KR)
SHIN YE JI (KR)
CHA SEUNG EUN (KR)
SHIN YE JI (KR)
CHA SEUNG EUN (KR)
International Classes:
G01N29/24; G01N29/06; G01N29/36
Foreign References:
| JP2013088240A | 2013-05-13 | |||
| KR101141113B1 | 2012-05-02 | |||
| JP2005148009A | 2005-06-09 | |||
| JP2006162321A | 2006-06-22 | |||
| JP2005274583A | 2005-10-06 |
Attorney, Agent or Firm:
NAM, Seung-Hee et al. (KR)
Download PDF: