DEFECT DETECTION METHOD, METHOD FOR REPAIRING ORGANIC EL ELEMENT, AND ORGANIC EL DISPLAY PANEL

WIPO Patent Application WO/2013/186961

A1

This defect detection method is to be performed with respect to an organic EL element having a first electrode (12), a second electrode (17), and a functional layer (16) and a light emitting layer (15), which are sandwiched between the first electrode (12) and the second electrode (17). The defect detection method has: a deduction point distinguishing step wherein, in the cases where the organic EL element has a defect portion (3) to be a factor of causing non-light emission between the first electrode (12) and the second electrode (17), electrical resistance of a first portion (16c) of the functional layer (16), said first portion corresponding to the defect portion (3), is reduced by applying a voltage for distinguishing a deduction point where the light emitting layer (15) does not emit light, said deduction point being between the first electrode (12) and the second electrode (17); and a deduction point detection step wherein, after the deduction point distinguishing step, the deduction point is detected by applying a light emission necessary voltage at which the light emitting layer (15) emits light if the organic EL element is normal without the defect portion (3) between the first electrode (12) and the second electrode (17).

SHIMAMURA TAKAYUKI
HAYASHIDA YOSHIKI
SHIOTA AKINORI
TSUCHIDA SHINYA

PCT/JP2013/001015

December 19, 2013

February 22, 2013

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PANASONIC CORP (JP)

H05B33/12; G09F9/00; G09F9/30; H01L27/32; H01L51/50; H05B33/10

JP2006154793A	2006-06-15
JP2010267420A	2010-11-25
JP2008066003A	2008-03-21
JP2008097828A	2008-04-24
JP2005276600A	2005-10-06
JP2005310659A	2005-11-04

NAKAJIMA, Shiro et al. (JP)
Shiro Nakajima (JP)

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