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Patent Searching and Data


Title:
DEFECT FACTOR ESTIMATION DEVICE AND DEFECT FACTOR ESTIMATION METHOD
Document Type and Number:
WIPO Patent Application WO/2018/146768
Kind Code:
A1
Abstract:
A defect factor estimation device of this invention is characterized by including: a data collection unit which collects category data of a device configuring a facility; a correlation calculation unit which calculates a correlation index of data that includes the category data which has been collected by the data collection unit; a data extraction unit which on the basis of a change in the correlation index calculated by the correlation calculation unit, extracts, as data about a defect, a combination of data that includes the category data; and a causal relationship estimation unit which extracts, from among data that is related to the data about the defect, data that is estimated as a defect factor. According to this configuration, a defect, which could not be detected by an existing technique, can be detected.

Inventors:
TOYAMA YASUHIRO (JP)
Application Number:
PCT/JP2017/004731
Publication Date:
August 16, 2018
Filing Date:
February 09, 2017
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Assignee:
MITSUBISHI ELECTRIC CORP (JP)
International Classes:
G05B23/02
Foreign References:
JP2011243118A2011-12-01
JP2013041173A2013-02-28
Attorney, Agent or Firm:
MURAKAMI, Kanako et al. (JP)
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