Title:
DEFECT INSPECTION DEVICE, DEFECT INSPECTION METHOD, AND PROGRAM
Document Type and Number:
WIPO Patent Application WO/2016/139928
Kind Code:
A1
Abstract:
The purpose of the present invention is to provide a defect inspection device that, when a flying object is used as a travel means, reduces on-board weight and performs stable defect inspection. In order to achieve said purpose, the present invention comprises: a travel unit 11 capable of freely traveling within a space; an inspection unit 12 that performs wall surface inspection in an inspection target area of an inspection structure; an arm unit 16 having the inspection unit 12 provided at one end thereof; and an orientation unit 13 that rotates the arm unit 16 and controls the direction of the inspection unit 12. The arm unit 16 is mounted on the travel unit 11, off-center in the horizontal direction of the travel unit 11.
Inventors:
SHIMIZU MOTOAKI (JP)
Application Number:
PCT/JP2016/001094
Publication Date:
September 09, 2016
Filing Date:
March 01, 2016
Export Citation:
Assignee:
NEC CORP (JP)
International Classes:
G01N29/265; G01N29/04
Foreign References:
| JP2012145346A | 2012-08-02 | |||
| JP2015219028A | 2015-12-07 |
Other References:
See also references of EP 3267191A4
Attorney, Agent or Firm:
SHIMOSAKA, NAOKI (JP)
Naoki Shimosaka (JP)
Naoki Shimosaka (JP)
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