Title:
DEFECT INSPECTION METHOD FOR POLARIZING PLATE
Document Type and Number:
WIPO Patent Application WO/2022/186068
Kind Code:
A1
Abstract:
Provided is an inspection method with which the presence or absence of defect in a polarizing plate can be determined easily. This defect inspection method is for a polarizing plate included in an optical laminate. The optical laminate includes the polarizing plate and a surface protection film. The polarizing plate includes a polarizer. An angle formed between an absorption axis of the polarizer and a slow axis of the surface protection film is within the range of 0°±24° or the range of 90°±24°. A polarizing filter and a light source are arranged in this order on the surface protection film side of the optical laminate. The absorption axis of the polarizer and an absorption axis of the polarizing filter are roughly orthogonal to each other.
Inventors:
KOBAYASHI SHINJI (JP)
SEO YONGWON (KR)
KIM DAECHUL (KR)
KIM HYEONGWOOK (KR)
JUNG BYOUNGSUN (KR)
SEO YONGWON (KR)
KIM DAECHUL (KR)
KIM HYEONGWOOK (KR)
JUNG BYOUNGSUN (KR)
Application Number:
PCT/JP2022/007857
Publication Date:
September 09, 2022
Filing Date:
February 25, 2022
Export Citation:
Assignee:
SUMITOMO CHEMICAL CO (JP)
DONGWOO FINE CHEM CO LTD (KR)
DONGWOO FINE CHEM CO LTD (KR)
International Classes:
G02B5/30; B32B7/023; B32B27/00; G01N21/892
Foreign References:
| JPH09258022A | 1997-10-03 | |||
| JP2001221917A | 2001-08-17 | |||
| JP2002003622A | 2002-01-09 | |||
| JPH08294988A | 1996-11-12 | |||
| JP2017111432A | 2017-06-22 | |||
| JP2021018354A | 2021-02-15 | |||
| KR20080099542A | 2008-11-13 | |||
| US20170348957A1 | 2017-12-07 |
Attorney, Agent or Firm:
FUKAMI PATENT OFFICE, P.C. (JP)
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