Title:
DEFECT LAYER DETECTION METHOD AND SYSTEM BASED ON LIGHT FIELD CAMERA AND DETECTION PRODUCTION LINE
Document Type and Number:
WIPO Patent Application WO/2022/126871
Kind Code:
A1
Abstract:
The present invention provides a defect layer detection method and system based on a light field camera, a detection production line and a corresponding computer readable storage medium. The defect layer detection method comprises the steps of acquiring a distance from a defect to a depth reference plane according to depth reference plane information and defect depth information; and obtaining a spatial position of the defect in a to-be-detected product according to the distance from the defect to the depth reference plane and structural information of the to-be-detected product. According to the present invention, the three-dimensional detection on the defect of a product such as a screen can be realized by using the light field camera, and the position of the defect in a product structure can be judged precisely.
Inventors:
LI HAOTIAN (CN)
QIAN ZHIWEN (CN)
QIAN ZHIWEN (CN)
Application Number:
PCT/CN2021/079838
Publication Date:
June 23, 2022
Filing Date:
March 09, 2021
Export Citation:
Assignee:
VOMMA SHANGHAI TECH CO LTD (CN)
International Classes:
G06T7/00
Foreign References:
| CN105842885A | 2016-08-10 | |||
| CN110349132A | 2019-10-18 | |||
| CN111351446A | 2020-06-30 | |||
| CN109765245A | 2019-05-17 | |||
| CN105300308A | 2016-02-03 | |||
| US20180103247A1 | 2018-04-12 |
Attorney, Agent or Firm:
DUAN&DUAN LAW FIRM (CN)
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