DEFECTIVE IMAGE CLASSIFICATION APPARATUS AND DEFECTIVE IMAGE CLASSIFICATION METHOD

Title:

DEFECTIVE IMAGE CLASSIFICATION APPARATUS AND DEFECTIVE IMAGE CLASSIFICATION METHOD

Document Type and Number:

WIPO Patent Application WO/2017/203572

Kind Code:

A1

Abstract:

This defective image classification apparatus is provided with: a defect type instruction unit that instructs on the types of defects regarding defective images; and a defect classification unit that classifies the defective images. The defect type instruction unit is provided with: a display unit that has a screen for displaying the lists of defective images and defect type labels and an indicator; a coordinate value analysis unit that analyzes a coordinate value when the indicator displayed on the screen of the display unit is moved; and a defect type labeling unit that associates defects displayed on the display unit with defect types displayed in the list of defect type labels on the basis of information about the coordinate value of the indicator analyzed by the coordinate value analysis unit. The defect classification unit is configured to classify the defective images by using information about a relationship between the defective images and the defect types associated with each other by the defect type labeling unit, and time and labor can be reduced by reducing a defect type instruction burden imposed on a user.

Inventors:

HARADA MINORU (JP)
TAKAGI YUJI (JP)
HIRAI TAKEHIRO (JP)
KONDO NAOAKI (JP)

Application Number:

PCT/JP2016/065189

Publication Date:

November 30, 2017

Filing Date:

May 23, 2016

Export Citation:

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Assignee:

HITACHI HIGH TECH CORP (JP)

International Classes:

G01N23/225; G01N21/956

Foreign References:

JP2015148981A	2015-08-20
JP2015038441A	2015-02-26