Title:
DEFORMATION CALCULATION DEVICE, DEFORMATION MEASUREMENT DEVICE, AND DEFORMATION CALCULATION METHOD
Document Type and Number:
WIPO Patent Application WO/2022/172507
Kind Code:
A1
Abstract:
Provided is a deformation calculation device for calculating deformation by correcting a change in position with respect to a measurement subject using one camera, even if there is no non-moving reference point. The invention is provided with: a deformation calculation unit (11) for finding simple calculation deformation of a measurement region (2) by digital image correlation; a viewpoint change removal unit (12) for finding a provisional deformation by deducting from the simple calculation deformation an apparent strain back-calculated by assuming there to be no deformation in the measurement region (2); and an integrating unit (13) for outputting, as deformation of the measurement region (2) from a first imaging period to a second imaging period, the result of averaging the provisional deformation found by sequentially changing a first image selected from a first image group and a second image selected from a second image group and applying the deformation calculation unit (11) and the viewpoint change removal unit (12).
Inventors:
SAJI SHIGETAKA (JP)
HANA NORIHIKO (JP)
HANA NORIHIKO (JP)
Application Number:
PCT/JP2021/038001
Publication Date:
August 18, 2022
Filing Date:
October 14, 2021
Export Citation:
Assignee:
MITSUBISHI ELECTRIC CORP (JP)
International Classes:
G01B11/16; G01C11/06; G06T7/60
Foreign References:
| JP2007240218A | 2007-09-20 | |||
| JP2006329628A | 2006-12-07 | |||
| JP2013170829A | 2013-09-02 | |||
| JP2019011984A | 2019-01-24 |
Attorney, Agent or Firm:
PALMO PATENT FIRM, P.C. (JP)
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