Title:
DEFORMATION DETECTION SYSTEM AND DEFORMATION DETECTION METHOD
Document Type and Number:
WIPO Patent Application WO/2021/044628
Kind Code:
A1
Abstract:
A deformation detection system (100) comprises an acquisition unit (21), data conversion unit (22), and level difference detection unit (23). The acquisition unit (21) acquires three-dimensional point cloud data that is data representing the surface of a structure as a three-dimensional point cloud and shape data indicating the shape of the structure. The data conversion unit (22) sets a reference surface corresponding to the surface of the structure on the basis of the shape data and converts the three-dimensional point cloud data into element point cloud data including data for a plurality of element points that each express the amount of deviation from the reference surface of the position of one point selected from a plurality of points arranged in a matrix on the reference surface. The level difference detection unit (23) detects the position of a level difference on the surface of the structure on the basis of the result of subjecting the plurality of element points included in the element point cloud data to a difference-of-Gaussian filter.
Inventors:
KAMEI KATSUYUKI (JP)
IRIE MEGUMI (JP)
IRIE MEGUMI (JP)
Application Number:
PCT/JP2019/035261
Publication Date:
March 11, 2021
Filing Date:
September 06, 2019
Export Citation:
Assignee:
MITSUBISHI ELECTRIC CORP (JP)
International Classes:
G01B21/20; G01B11/00; G06T7/50
Foreign References:
| JPH08219734A | 1996-08-30 | |||
| JP2012037490A | 2012-02-23 | |||
| JP2012098939A | 2012-05-24 | |||
| JP2018115937A | 2018-07-26 |
Attorney, Agent or Firm:
TAKAMURA, Jun (JP)
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