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Patent Searching and Data


Title:
DEFORMATION MEASUREMENT SENSOR FOR MEASURING PRESSURE AND SHEARING FORCE AND STRUCTURE THEREFOR
Document Type and Number:
WIPO Patent Application WO/2013/191333
Kind Code:
A1
Abstract:
A deformation measurement sensor for measuring pressures and shearing forces according to the present invention includes: a plurality of beams shaped like a lattice; a strain gauge attached to each of the plurality of beams for measuring a deformation rate; a frame connected to the end of the lattice shape for surrounding the plurality of beams; and holes for arranging lines and formed in the intersections of the plurality of beams, whereby it is possible to precisely measure the deformation rate depending on the pressures or shearing forces exerted to a plurality of areas.

Inventors:
KIM YOUNG OUK (KR)
HWANG JUNG HOON (KR)
Application Number:
PCT/KR2012/009118
Publication Date:
December 27, 2013
Filing Date:
November 01, 2012
Export Citation:
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Assignee:
KOREA ELECTRONICS TECHNOLOGY (KR)
International Classes:
G01B7/16; G01L1/22
Foreign References:
JPH0755598A1995-03-03
KR100499970B12005-07-11
KR20110130332A2011-12-05
KR100347334B12002-08-07
JP2008116371A2008-05-22
JP2005249772A2005-09-15
Attorney, Agent or Firm:
PARK, CHONG HAN (KR)
박종한 (KR)
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