Title:
DEMODULATION OF INTENSITY MODULATION IN X-RAY IMAGING
Document Type and Number:
WIPO Patent Application WO/2015/038793
Kind Code:
A8
Abstract:
X-ray grating based and grid based imagers formed a fringe pattern modulated by a specimen. An X-ray beam is scanned so that the fringe pattern is modulated by these specimen along a plurality of projection directions. Corresponding fringe patterns are detected and aligned so as to produce a specimen phase image. X-ray beam scanning is based on electric or magnetic deflection of an electron beam to an X-ray generating target.
Inventors:
WEN HAN (US)
MIAO HOUXUN (US)
MIAO HOUXUN (US)
Application Number:
PCT/US2014/055224
Publication Date:
May 28, 2015
Filing Date:
September 11, 2014
Export Citation:
Assignee:
US HEALTH (US)
International Classes:
G01N23/04
Attorney, Agent or Firm:
JONES, Michael, D. (LLPOne World Trade Center, Suite 1600,121 SW Salmon Stree, Portland OR, US)
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