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Patent Searching and Data


Title:
DEPTH DATA MEASUREMENT APPARATUS AND APPLICATION METHOD THEREFOR
Document Type and Number:
WIPO Patent Application WO/2024/027653
Kind Code:
A1
Abstract:
Disclosed are a depth data measurement apparatus and an application method therefor. The measurement apparatus comprises: a projection assembly, which is used for projecting linear light to an imaging object which is moving relatively; an image sensor, which is used for performing imaging on the basis of reflected light of the linear light, and when a change in a light flux received by each pixel within a unit of time exceeds a threshold value, sending a valid signal having a timestamp; and a processor, which is used for calculating surface depth information of the imaging object on the basis of a pixel position at which the valid signal is reported, the timestamp and relative-movement information. In the present invention, active light imaging is performed, by using linear light, on an imaging object which is moving relatively, imaging is performed only on a changed valid signal in combination with an image sensor which can independently generate valid signals when the brightness of each pixel changes, and the position of depth data is determined by using a timestamp and relative-movement information, such that depth information is acquired and processed at high speed with a simple projection mechanism and an extremely low computing power requirement.

Inventors:
WANG MINJIE (CN)
LIANG YUSHI (CN)
Application Number:
PCT/CN2023/110258
Publication Date:
February 08, 2024
Filing Date:
July 31, 2023
Export Citation:
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Assignee:
SHANGHAI PERCIPIO TECH LIMITED (CN)
International Classes:
A61B6/03; G01B11/25; G06T7/514
Foreign References:
CN111721238A2020-09-29
CN106067954A2016-11-02
CN112766328A2021-05-07
CN114549609A2022-05-27
US20210334992A12021-10-28
Attorney, Agent or Firm:
ZYX INTELLECTUAL PROPERTY LAW FIRM (CN)
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