DETECTION APPARATUS AND DETECTION METHOD FOR DEFECT OF DISPLAY PANEL, AND MICROSCOPE

WIPO Patent Application WO/2018/205592

A1

A detection apparatus for a defect of a display panel and a detection method for a defect of a display panel, and a microscope. The detection apparatus for a defect of a display panel comprises: a conversion component (3) connected to a microscope (10); a detection component (1) which is arranged on the conversion component (3) and has a first visual region, the detection component (1) being configured to detect a position where a micro defect exists on a display panel; and a marking component (2) which is arranged on the conversion component (3) and has a second visual region the area of which is smaller than that of the first visual region, the marking component (2) being configured to mark the position where the micro defect exists on the display panel, wherein the conversion component (3) is configured to rotate the marking component (2) to the position of the detection component (1) after the detection component (1) has detected the position where the micro defect exists, and the marking component (2) marks the position.

LIU TIENAN (CN)
WANG YUELIN (CN)
WANG YANMING (CN)
MENG WEIXIN (CN)
FANG YEZHOU (CN)
XU JINGYI (CN)
ZHAO YANYAN (CN)
REN YANWEI (CN)

PCT/CN2017/115454

November 15, 2018

December 11, 2017

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BOE TECHNOLOGY GROUP CO LTD (CN)
ORDOS YUANSHENG OPTOELECTRONICS CO LTD (CN)

G01N21/01; G01N21/88

CN106290376A	2017-01-04
CN104614263A	2015-05-13
CN105026883A	2015-11-04
CN104317079A	2015-01-28
CN101140364A	2008-03-12
US20090091823A1	2009-04-09

See also references of EP 3623800A4
None

TEE & HOWE INTELLECTUAL PROPERTY ATTORNEYS (CN)

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