Title:
DETERMINING CHANGES IN THE X-RAY EMISSION YIELD OF AN X-RAY SOURCE
Document Type and Number:
WIPO Patent Application WO/2012/069944
Kind Code:
A8
Abstract:
The present invention relates to determining changes in the X-ray emission yield of an X-ray tube, in particular determining dose degradation. In order to provide determination of such changes, an X-ray source is provided comprising a cathode, an anode; and at least one X-ray sensor (16). The cathode emits electrons towards the anode and the anode comprises a target area on which the electrons impinge, generating X-ray radiation. An X-ray barrier (24) is provided with an aperture (26) for forming an emitting X-ray beam from the X-ray radiation, wherein the emitting X-ray beam has a beam formation (30) with a central axis. The at least one X-ray sensor is arranged within the beam formation and measures the X-ray intensity for a specific direction of X-ray emission with an angle with respect to the central axis. The at least one X- ray sensor can be positioned inside the beam formation (30), but outside the "actual field of view" (40) as determined by a diaphragm (36).
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Inventors:
SPRONG HANS PETER (NL)
DUERR MARTIN KIMUTAI (DE)
KIEWITT RAINER (DE)
DUERR MARTIN KIMUTAI (DE)
KIEWITT RAINER (DE)
Application Number:
PCT/IB2011/054871
Publication Date:
May 23, 2013
Filing Date:
November 02, 2011
Export Citation:
Assignee:
KONINKL PHILIPS ELECTRONICS NV (NL)
PHILIPS INTELLECTUAL PROPERTY (DE)
SPRONG HANS PETER (NL)
DUERR MARTIN KIMUTAI (DE)
KIEWITT RAINER (DE)
PHILIPS INTELLECTUAL PROPERTY (DE)
SPRONG HANS PETER (NL)
DUERR MARTIN KIMUTAI (DE)
KIEWITT RAINER (DE)
International Classes:
H01J35/02; H05G1/30
Attorney, Agent or Firm:
VAN VELZEN, Maaike, M. et al. (Building 44, AE Eindhoven, NL)
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