Title:
DEVICE ABNORMALITY MONITORING METHOD AND SYSTEM
Document Type and Number:
WIPO Patent Application WO/2010/143492
Kind Code:
A1
Abstract:
A technique which relates to a device abnormality monitoring method, and which is capable of implementing highly accurate abnormality detection, cause diagnosis, or the like. A system which relates to the monitoring of a newly-installed device (T) among a plurality of similar devices (1), wherein a determination model creating module (2) creates a separate determination model (prediction model) for each of a plurality (K) of already-existing similar devices (a, b, or the like), creates a meta prediction model for predicting coefficients and segments of the prediction models from the feature item value or the like of each of the devices (1), and generates a prediction model exclusively for the device (T) (determination model configured by including the device (T)) from the meta prediction model. Using the determination model, a determination module (3T) monitors the condition of the device (T) to perform the abnormality detection.
Inventors:
TAMAKI, Kenji (HITACHI LTD., 292, Yoshida-cho, Totsuka-ku, Yokohama-sh, Kanagawa 17, 〒2440817, JP)
玉置 研二 (〒17 神奈川県横浜市戸塚区吉田町２９２番地 株式会社日立製作所 生産技術研究所内 Kanagawa, 〒2440817, JP)
玉置 研二 (〒17 神奈川県横浜市戸塚区吉田町２９２番地 株式会社日立製作所 生産技術研究所内 Kanagawa, 〒2440817, JP)
Application Number:
JP2010/058104
Publication Date:
December 16, 2010
Filing Date:
May 13, 2010
Export Citation:
Assignee:
HITACHI, LTD. (6-6 Marunouchi 1-chome, Chiyoda-ku Tokyo, 80, 〒1008280, JP)
株式会社日立製作所 (〒80 東京都千代田区丸の内一丁目６番６号 Tokyo, 〒1008280, JP)
TAMAKI, Kenji (HITACHI LTD., 292, Yoshida-cho, Totsuka-ku, Yokohama-sh, Kanagawa 17, 〒2440817, JP)
株式会社日立製作所 (〒80 東京都千代田区丸の内一丁目６番６号 Tokyo, 〒1008280, JP)
TAMAKI, Kenji (HITACHI LTD., 292, Yoshida-cho, Totsuka-ku, Yokohama-sh, Kanagawa 17, 〒2440817, JP)
International Classes:
G08B31/00; G08B29/02
Attorney, Agent or Firm:
TSUTSUI, Yamato (Tsutsui & Associates, 3F Shinjuku Gyoen Bldg. 3-10, Shinjuku 2-chome, Shinjuku-k, Tokyo 22, 〒1600022, JP)
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