Title:
DEVICE ADJUSTMENT INSTRUMENT, ADDITIVE MANUFACTURING DEVICE, ADDITIVE MANUFACTURING METHOD, AND PROGRAM
Document Type and Number:
WIPO Patent Application WO/2019/189639
Kind Code:
A1
Abstract:
Provided are a device adjustment instrument for realizing an optimum operating condition in each additive manufacturing device, an additive manufacturing device, an additive manufacturing method, and a program. To achieve the purpose of the present invention, a device adjustment instrument (10) is provided with a storage unit (12) for storing standard test piece data corresponding to each of a plurality of standard test pieces which can be manufactured by additive manufacturing devices (E11 through E1n) and a standard parameter set for when the standard test pieces are manufactured, a selection unit (11a) for selecting standard test piece data that match modeling specification data of a specified object from a plurality of standard test piece data on the basis of the modeling specification data, and an adjustment unit (11b) for generating a modeling parameter set for adjusting an operating condition of the additive manufacturing devices (E11 through E1n) on the basis of the selected standard test piece data and test modeling result data manufactured by the additive manufacturing devices (E11 through E1n) using the standard parameter set corresponding to the standard test piece data.
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Inventors:
INOUE YUKIHIKO (JP)
Application Number:
PCT/JP2019/013755
Publication Date:
October 03, 2019
Filing Date:
March 28, 2019
Export Citation:
Assignee:
MITSUBISHI HEAVY IND LTD (JP)
International Classes:
B29C64/386; B22F3/10; B22F3/105; B22F3/16; B22F3/24; B29C64/153; B29C64/379; B33Y50/02
Domestic Patent References:
WO2016042810A1 | 2016-03-24 | |||
WO2017020894A1 | 2017-02-09 |
Foreign References:
JP2015016680A | 2015-01-29 | |||
US20130179388A1 | 2013-07-11 |
Other References:
See also references of EP 3756862A4
Attorney, Agent or Firm:
FUJITA Takaharu (JP)
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